Why Choose Arise The O+K Thickness Measurement System
The O+K thickness measurement system circuitly detects the thickness of each measuring point through the electric guide rail with a thickness measuring sensor, generates a curve, can set an upper and lower limit alarm, and realizes the roll clearance, shaft crossing, and bending degree control of the roll through the data exchange with the calendering host. Internal data management and analysis system provides historical data viewing and analysis, which is convenient for production quality control.
X-ray XCH-6000 Performance Parameters
| Scanning speed | 0-25m/min |
| Scanning positioning accuracy | 0.1μm |
| Upper and lower sensor synchronisation accuracy | 0.1μm |
| Measurement unit | g/m² 、mg/m² 、 μm 、mm |
| Ambient temperature | 0-60℃ |
| Ambient humidity | ≤95%(no-condensing) |
| Overall machine power | 2000W |
| Space gap | 18mm |
| Measuring width | 0-10M |
| Repeated measurement accuracy | 0.1-0.15μm |
