XCH-6000 X-ray In-line Thickness Measurement System
- It measures thickness based on the attenuation of X-rays as they penetrate the object, and by analyzing the degree of energy loss within the material.
- Non-destructive inspection technology used for material thickness detection.
- It provides accurate and reliable data support for quality control, product testing, and real-time monitoring during production processes.
- Due to the use of low-radiation SOFT-XRAY technology, no special permits or regulatory procedures are required for its operation.
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Why Choose XCH-6000 X-ray In-line Thickness Measurement System
O+K X-ray thickness measurement system is an important non-destructive inspection technology used for material thickness detection. The system is characterized by high measurement accuracy and simple operation. It provides accurate and reliable data support for quality control, product testing, and real-time monitoring during production processes. It is widely used in industries such as lithium battery manufacturing and other related fields.
Working Videos of XCH-6000 X-ray In-line Thickness Measurement System
Performance Parameters of XCH-6000 X-ray In-line Thickness Measurement System
| Scanning speed | 0-20m/min |
| Scanning positioning accuracy | 0.1μm |
| Upper and lower sensor synchronisation accuracy | 0.1μm |
| Measurement unit | g/m² 、mg/m² 、 μm 、mm |
| Ambient temperature | 0-60℃ |
| Ambient humidity | ≤95%(no-condensing) |
| Overall machine power | 2000W |
| Space gap | 18mm |
| Measuring width | 0-10M |
| Repeated measurement accuracy | 0.1-0.15μm |
Note: Accurate precision can only be calculated based on the actual material width and running speed.
